[top,dv] Add testplan for top-level - #668
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marnovandermaas
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My initial review.
| "i2c_host_tx_rx_cheri"] | ||
| } | ||
| { | ||
| name: chip_i2c_device_tx_rx |
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What about i2c host?
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What do you mean? i2c_host is just above.
| SW flushes both FIFOs, acknowledges any pending interrupts, sets threshold | ||
| registers to `MAILBOX_FIFO_DEPTH`, enables all three interrupts, then: | ||
| - Confirms the read FIFO is empty and write FIFO is not full. | ||
| - Writes `MAILBOX_FIFO_DEPTH` elements (0xBEEF0000..N) and confirms the write |
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Why did you chose the value BEEF0000?
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It's just an arbitrary value easy to find in ca log or waves. Do you have another suggestion?
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It's a bit sad that you are adding the image files before they are available. Is there a cleaner way to add a test that is expected to fail?
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I haven't found any other way, and I took this path as it has been mentioned in a meeting that it's good to see some red tests becoming green eventually. I agree with that, then we know directly from a quick glance at the dashboard where we stand. Do you have another suggestion?
Signed-off-by: martin-velay <mvelay@lowrisc.org>
Signed-off-by: martin-velay <mvelay@lowrisc.org>
Signed-off-by: martin-velay <mvelay@lowrisc.org>
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@marnovandermaas, I have implemented most of your feedback and answer to your questions. The comment I've marked as resolved are because I am certain it's addressed. I also did some simplification about the IRQ tests and added a forgotten link to the testplan from the sim_cfg file. |
marnovandermaas
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I've had another go at reviewing this PR, but I think it still has too many mistakes to approve it. I haven't yet gone through the body text since I already found some mistakes in the categorisation and the test titles, but I assume there will be many more mistakes in the body. My opinion is that we need to cut the pull request down significantly if we are going to merge this in a reasonable time. To make it more manageable, what do you think about deleting the description body text (not the initial sentence) for all the V2 items and that you have a go at checking/rewriting the body text for the V1 points to gain confidence that there are no mistakes there?
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Is there a way to prove that these two are equivalent? I don't really want to spend the time manually checking that everything is still there after the re-order.
| every byte read back matches the byte written, confirming an agent-driven | ||
| controller-mode transaction over the chip I2C pins in both directions. | ||
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| Both vanilla and CHERI firmware images are exercised. |
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I don't think it's worth repeating this for each test.
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| { | ||
| name: chip_clkmgr_smoke | ||
| desc: '''Verify software control of gateable and hintable clocks via the clock manager. |
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The software and hint clocks are unused in Mocha and are likely to be removed in the future.
| "clkmgr_smoke_cheri"] | ||
| } | ||
| { | ||
| name: chip_clkmgr_clock_gating |
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Clock gating is currently not used in the Mocha design and not sure if this will be included in the future.
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| Both vanilla and CHERI firmware images are exercised. | ||
| ''' | ||
| stage: V1 |
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Is this necessary for V1 or can this be V2?
| once the chip returns to active power. | ||
| ''' | ||
| stage: V2 | ||
| tests: ["rv_dm_access_after_wakeup"] |
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Why does this not have CHERI version?
| /////////////////////////////////////////////////////////////////////////// | ||
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| { | ||
| name: chip_alert_handler_smoke |
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There is no alert handler in Mocha.
Create the full testplan for existing and future tests for top-level DV.